TEA's comprehensive Thermal Test System (TTS) integrates all measurement and control components required for complete semiconductor thermal characterization workflows. The TTS combines TEA's thermal test chips, measurement electronics, and controlled test environment into a fully integrated solution.

System Components

• Thermal measurement electronics (current source, voltmeter)
• Power supply and control
• Temperature-controlled test environment
• Data acquisition and analysis software
• Compatible with TEA TTC chips, TTVs, and TTBs

Measurements Supported

• Thermal resistance (θJA, θJC, θJB, ψJT, ψJB)
• Thermal impedance (transient thermal analysis)
• TIM thermal characterization
• Structure functions